| 摘要 |
PURPOSE:To sort a good chip and to accelerate the analysis of an improper region at function block unit by providing a pad for a prove and a bidirectional buffer. CONSTITUTION:A pad 16 for a probe capable of observing a signal is provided at the connecting wire 13 of a flip-flop scan path output signal as one of wirings between function blocks, and a bidirectional buffer 8 capable of being controlled by a shift mode signal 14 and observing a signal through a bidirectional terminal 9 is provided. Accordingly, the function block units are divided, a plurality of scan path observing points of the flip-flop are provided to finely divide a testing range into block units, and a defective block can be observed without waiting the observed result of the final block. Thus, a defect test can be accelerated at high speed.
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