| 摘要 |
PURPOSE:To shorten a test time and to facilitate the formation of a test pattern by controlling the output of an address register for a memory according to the internal state of a mode register. CONSTITUTION:When the function of an IC which has 16-bit data length and 9-bit address length of the memory is tested, a signal indicating the test mode is outputted to a control signal line 7. A signal 5 is a system clock, and a signal is a write control signal for the address register; when the signal 6 is '1' and the clock rises, data are written from address registers 1 and 1' and signals on address register output signal line groups 4 and 4' vary. Then, the high-order 8 bits of address registers are outputted from an external signal group 2 and the low-order 8 bits of the address registers are outputted from the signal line group 2 in a next cycle. |
