发明名称 VACUUM APPARATUS
摘要 PURPOSE:To contrive reduction of an imperfect product due to a foreign matter by subjecting the inside of a vacuum tank to sandblast working and inhibiting the peeling of the foreign matter stuck to the inside and preventing dust generation during the operation such as ion milling. CONSTITUTION:In case of performing operation in the inside of a vacuum tank such as an ion milling apparatus and a sputtering apparatus, sandblast working is performed in the inside of the vacuum tank. Thereby, for example, even if a substance subjected to ion milling is sputtered on the inside wall of the vacuum tank, natural peeling is prevented because the surface is roughened. Therefore, dust generation during formation of a thin film and etching is prevented and an imperfect product due to a foreign matter is reduced.
申请公布号 JPS62112778(A) 申请公布日期 1987.05.23
申请号 JP19850252801 申请日期 1985.11.13
申请人 HITACHI LTD;HITACHI DEVICE ENG CO LTD;HITACHI MICRO COMPUT ENG LTD 发明人 MAEDA TOSHIO;OBARA TAKASHI
分类号 C23C14/34;C23C14/00;C23F4/00 主分类号 C23C14/34
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