发明名称 IC TESTER FOR PREHEATER
摘要 PURPOSE:To detect an IC without enlarging the space dimensions between parts by setting such that one of two optical axes crosses a small size IC transfer lane, the other crosses a medium size IC transfer lane but does not cross a heater. CONSTITUTION:An optical axis B is so set that it crosses a medium size IC2b on a small size IC transfer lane La, does not cross a medium size IC2b on a medium size IC transfer lane Lb but crosses a large size IC2c on a large size IC transfer lane Lc. Similarly, an optical axis C is so set that it crosses the medium size IC2b and the large size IC2c but does not cross a small size IC2a. Since the optical axes B and C are substantially vertically set within the range wherein the axes do not cross an electric heater 13a, it results that light projectors and light receivers (4b, 4c) and (5b, 5c) are positioned obliquely below and above a chute rail 11 and a heat block 13, respectively. Therefore, the space dimensions from adjacent rails 11' and 11'' and adjacent blocks 13' and 13'' are not increased.
申请公布号 JPS62113090(A) 申请公布日期 1987.05.23
申请号 JP19850251940 申请日期 1985.11.12
申请人 HITACHI ELECTRONICS ENG CO LTD 发明人 KASAI SHINICHI;SUZUKI TETSUYA
分类号 G01R31/26;G01V8/20 主分类号 G01R31/26
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