Arrangement for examining the edge quality of semi-finished products in board form

摘要

The invention relates to an arrangement for examining the edge quality of semi-finished products in board form, such as preferably cut-to-size chipboards running through production operations. The aim is to develop an efficient contactless examining arrangement which is largely insensitive to external effects. The object is to use CCD image sensor technology known per se to provide an examining arrangement which permits an assessment of the edge quality of components having variations in position, thickness or colour, and possibly subjected to vibrations, of good quality and quantifiable with regard to the geometrical nature of edge defects. The object is achieved by directing a focused light beam onto the narrow surface of the product to be examined in such a way that part of the light strikes the narrow surface perpendicularly and another part is incident in a part running parallel just over the broad surface. Arranged perpendicularly above the edge to be examined is the CCD row of a CCD camera known per se, which receives the reflected light components.