<p>A coaxial test probe employs a flexible inner conductor (34) that buckles upon the application of an axial load and is housed within a conductive outer sheath (12, 14, 18). The inner probe includes an insulating spacer (33) which forms a recess (38) applied to the protruding end of the inner conductor, such that buckling occurs within this recess. A plurality of adjacent probes are mounted on a test fixture at opposing angles to facilitate automatic interrogation of closely spaced contact pads.</p>
申请公布号
EP0222119(A1)
申请公布日期
1987.05.20
申请号
EP19860113230
申请日期
1986.09.26
申请人
INTERNATIONAL BUSINESS MACHINES CORPORATION
发明人
CADWALLADER, ROBERT H.;CELESTINO, ROBERT J.;COUGHLIN, CHARLES P.