| 摘要 |
A solid state scanning system includes a body of semiconductive material, such as cadmium sulfide, which exhibits moving high field instability effects, and a light projection system having Schlieren optics to detect surface disturbances caused by a propagating high field domain nucleated within the semiconductor body. The light is preferably directed onto the semiconductor surface by a plurality of louvered mirror strips which also detect the light reflections therefrom. The system may also include a display means to show the relief profile of the surface disturbances in the form of a raster of brightness information representing variations in the voltage across the domain which occurs during the propagation. A layer of a high coupling constant material can be provided on the device to enhance the disturbance effect. A liquid or plastic film can also be used on the device to introduce memory in the system. |
