发明名称 APPARATUS FOR MEASURING MICRO-KERR EFFECT
摘要 PURPOSE:To simplify adjustment work at the time of measurement and to shorten a measuring time, by arranging a half mirror between a laser oscillator and a polarizer and taking out compensation light for differential amplification. CONSTITUTION:A part of laser beam from an oscillator 1 is taken out by a half mirror 21 and quantity of beam is set by an analyzer 22 to be detected by a photodiode and the output thereof is supplied to a differential amplifier 12. The transmitted beam of the mirror 21 is linearily polarized by a polarizer 2 and converged by an objective lens 5 through mirrors 3, 4 to irradiate a specimen 14 magnetized by an exciting coil 13. The return beam from the specimen 14 is converted to voltage by a photodiode 10 through an analyzer 8 to be supplied to an amplifier 12. By this method, the variation in the intensity of laser beam of the oscillator 11 is absorbed.
申请公布号 JPS62106381(A) 申请公布日期 1987.05.16
申请号 JP19850246344 申请日期 1985.11.05
申请人 NIPPON TELEGR & TELEPH CORP <NTT> 发明人 YASUDA KYOSUKE
分类号 G01R33/032;G01R33/16 主分类号 G01R33/032
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