发明名称 WAVELENGTH SCANNING TYPE EMISSION SPECTROCHMICAL ANALYZING INSTRUMENT
摘要 PURPOSE:To permit the execution of an internal standard correction within the same time by providing a means with which the other spectroscope detects the wavelength of the internal standard element by scanning and is fixed at said wavelength before one spectroscope detects the wavelength of a measuring element by scanning. CONSTITUTION:The light from induction coupled plasma 1 is split 2 and one of the beams is made incident on the 1st spectroscope 4 and the other beam is made incident via a mirror 3 to the 2nd spectroscope 5. The light which is made monochromatic 4 enters a multiplexer (MUX)1 via a photomultiplier 6 and a preamplifier 10. The light which is similarly made monochromatic 5 enters an MUX12 via a photomultiplier 7 and a preamplifier 11. The signal changed over tat a high speed by the MUX12 enters a CPU16 via an A/D converter 13 and a CPU bus 15. On the other hand, both spectroscopes 4, 5 are subjected to wavelength driving 18 by a pulse motor driving circuit 14 and pulse motors 8, 9 and before the spectroscope 4 detects the wavelength of the measuring element by scanning, the spectroscope 5 detects the wavelength of the internal standard element by scanning and is fixed at that wavelength, by which the internal standard correction is made possible.
申请公布号 JPS62105036(A) 申请公布日期 1987.05.15
申请号 JP19850245353 申请日期 1985.11.01
申请人 HITACHI LTD;HITACHI INSTR ENG CO LTD 发明人 KOGA TADATAKA;MORIYA KAZUO;TOBISHIMA TAEKO
分类号 G01N21/62 主分类号 G01N21/62
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