发明名称 SPLIT TYPE VERTICAL PROBE
摘要 PURPOSE:To enable the flaw detection on a surface to be inspected both at close and far distances, by a method wherein vibrators are divided concentrically in the center of a circle and in the periphery thereof and the faces of each vibration in contact with an object to be detected are made flush with a bottom surface of a case through an acoustic split plane. CONSTITUTION:Round vibrators 1 for transmissioner arrange in the center and vibrators 2 done concentrically in the periphery of the vibrator 1. Both vibrators 1 and 2 with an object to be detected have contact faces 1a and 2a flush with a bottom surface of a case 3 through acoustic division plane 4. This split type vertical probe uses no delay material as there is no need for setting them on the vibrators 1 and 2 at any angle. Therefore, like ordinary non-split type vertical probe, the contact faces 1a and 2a of the vibrators 1 and 2 can directly get in contact with a flaw detecting surface of an object being detected. In addition, when both the vibrators 1 and 2 are switched over to transmission or reception simultaneously, elevated energy level of the ultrasonic beam can be used. This enable one probe to detect flaws continuously at the same time from close to the flaw detecting surface to far -- bottom surface.
申请公布号 JPS62103568(A) 申请公布日期 1987.05.14
申请号 JP19850242902 申请日期 1985.10.31
申请人 HITACHI CONSTR MACH CO LTD 发明人 MIYAJIMA TAKESHI
分类号 G01B17/02;G01N29/04;G01N29/24 主分类号 G01B17/02
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