发明名称 SEMICONDUCTOR HEAT TREATING DEVICE
摘要 PURPOSE:To equalize the requirements for heattreatment by a method wherein a non-linear introducing gas pre-heating tube is provided on the inner end of a heat resisting tube in connection to a gas introducing tube at the end of a heat resisting tube into which wafers are inserted. CONSTITUTION:An open type heat resisting tube 1 is inserted into a heating furnace 2 through the intermediary of a heat equalizing plate 3 and atmospheric gas is introduced from an atmospheric gas introducing pipe 4 to the furnace 2 to heattreat semiconductor wafers 10 internally fixed on the tube 1. An introducing gas pre-heating tube 11 is provided to maximize its length with its length inside the tube 1 minimized by means of e.g. making the tube 11 spiral. One end of the pre-heating tube 11 is connected to the introducing pipe 4 while the other end pierces a partition 12 to jet the atmospheric gas jetting from the partition 12 to a homogeniger 5. On the other hand, the space from an end of the tube 1 accommodating the pre-heating tube 11 to the partition 12 is filled with N2 gas as necessary and a baffle plate 13 is provided. Through these procedures, any dispersion of characteristics of the wafers 10 due to one time heattreatment may be reduced.
申请公布号 JPS6091621(A) 申请公布日期 1985.05.23
申请号 JP19830199135 申请日期 1983.10.26
申请人 TOSHIBA KK 发明人 NAGASAKA SHIYUUICHI
分类号 H01L21/205;H01L21/18;H01L21/22 主分类号 H01L21/205
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