METHOD OF FORMING ELECTRODE/WIRING LAYER

摘要

An interconnection structure including an electrode/wiring layer can be formed on a semiconductor substrate by forming on the semiconductor substrate an insulating structure having at least one recess in a surface thereof. At least one polycrystalline silicon layer is formed to fill the recess of the insulating structure. Then, an aluminum layer is formed to cover a surface of the insulating structure and a surface of the polycrystalline silicon layer. The polycrystalline silicon in the polycrystalline silicon layer and the aluminum in a portion of the aluminum layer which corresponds to the polycrystalline silicon layer are converted into a single alloy by heating to form an electrode/wiring layer comprising the single alloy in the recess and connected to a remaining portion of the aluminum layer.