发明名称 |
METHOD AND APPARATUS FOR TESTING SENSOR SIGNAL PROCESSOR |
摘要 |
Testing and protection apparatus for a signal processor which applies during testing a test signal obtained by applying to a reference ramp signal a certain dynamic compensation having a transfer function equal to the inverse of the transfer function of the signal processor. This test signal which is applied in place of the sensor signal should match the reference signal. When the response to the test signal is multiplexed back to the tester along with response signals from microcomputers, variable time skewing of the returned test signal is eliminated by feeding the reference signal through a processing path parallel to that of the test signal and then comparing those two signals in the tester. The reference signal is also used in the microcomputer to continually generate a dummy actuation signal which provides a continuous check on microcomputer operation. |
申请公布号 |
JPS6295608(A) |
申请公布日期 |
1987.05.02 |
申请号 |
JP19860245651 |
申请日期 |
1986.10.17 |
申请人 |
WESTINGHOUSE ELECTRIC CORP <WE> |
发明人 |
ARUBAATO UIRIAMU KURUU;UIRIAMU DENPUSHII GURISUTO ZA SAADO;GIRUBAATO UIRIAMU REMURII |
分类号 |
G01D18/00;G01R27/28;G05B9/03;G05B23/02;G06F11/16;G21C17/00 |
主分类号 |
G01D18/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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