发明名称 PERFECCIONAMIENTOS EN DISPOSITIVOS SEMICONDUCTORES PARA AISLADORES.
摘要 <p>A SOI device which permits both the kink effect to be avoided and threshold voltage to be regulated, and a new method for fabricating SOI ICs. The device (50) includes an electrically conductive pathway (120) extending from the active volume (60) and terminating in a non-active region of the substrate (20) of the device. A backgate bias is communicated to, and kink-inducing charges are conducted away from, the active volume through the conductive pathway. The fabrication method permits SOI ICs to be fabricated using available circuit designs and pattern delineating apparatus. This method involves the formation of a precursor substrate surface which includes islands of insulating material, each of which is encircled by a crystallization seeding area (170) of substantially single crystal semiconductor material. A layer of non-single crystal semiconductor material (45) is formed on the precursor substrate surface (30), crystallized and a IC is formed in.</p>
申请公布号 ES545707(D0) 申请公布日期 1987.05.01
申请号 ES20070005457 申请日期 1985.07.30
申请人 AMERICAN TELEPHONE & TELEGRAPH COMPANY 发明人
分类号 H01L29/78;H01L21/74;H01L21/86;H01L23/482;H01L27/06;H01L27/092;H01L27/12;H01L29/786;(IPC1-7):H01L27/01 主分类号 H01L29/78
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