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发明名称
TEST CIRCUIT
摘要
申请公布号
JPS6295476(A)
申请公布日期
1987.05.01
申请号
JP19850238125
申请日期
1985.10.22
申请人
MITSUBISHI ELECTRIC CORP
发明人
AKIYAMA SATOSHI
分类号
H03K19/00;G01R31/28
主分类号
H03K19/00
代理机构
代理人
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地址
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