发明名称 LAMINATED STRUCTURE TYPE SEMICONDUCTOR DEVICE
摘要 PURPOSE:To obtain a laminated structure type semiconductor device which can stably operate by forming an insulated gate transistor that source and drain potentials are not secured on a circuit configuration in a semiconductor substrate. CONSTITUTION:In a laminated structure type semiconductor device, polycrystalline silicon layers 19, 20 are used as the source and drain electrodes of wiring materials of an MOS transistor formed in a semiconductor substrate 11 of the first layer, polycrystalline silicon layers 21, 22 are used as gate electrodes of MOS transistors of the first and second layers. MOS transistors in which source and drain potentials are not secured to a predetermined potential in the circuit configuration are formed in the substrate 11 of the lowermost layer, back electrodes 31 are formed on the substrate 11, and the substrate potential is applied from here to secure the substrate potential. Thus, it can prevent an erroneous operation due to a bipolar operation.
申请公布号 JPS6286852(A) 申请公布日期 1987.04.21
申请号 JP19850228380 申请日期 1985.10.14
申请人 TOSHIBA CORP 发明人 SAITO SHINJI;ISOBE MITSUO
分类号 H01L21/8234;H01L21/8242;H01L27/06;H01L27/088;H01L27/10;H01L27/108 主分类号 H01L21/8234
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