METHOD FOR TESTING APPAY IC,申请号JP19850226140-传众专利搜索

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发明名称	METHOD FOR TESTING APPAY IC
摘要
申请公布号	JPS6283679(A)	申请公布日期	1987.04.17
申请号	JP19850226140	申请日期	1985.10.09
申请人	NEC CORP	发明人	WAKAUMI HIROO
分类号	H01L21/66;G01R31/28;G01R31/317;H01L21/822;H01L27/04	主分类号	H01L21/66
代理机构		代理人
主权项
地址

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