| 摘要 |
In test apparatus for testing control units used to control the operation of furnaces and the like, circuitry providing a variable voltage for checking control relay pull-in voltage, circuitry for testing impedance values of components of the furnace system, a plurality of indicator means driven by the control unit to indicate operability of a corresponding plurality of control unit circuits, temperature simulation means for simulating temperature conditions of said control unit when placed in a furnace system, a thermostat simulation circuit to simulate a thermostat system in connection with the control unit, and a recycler circuit to repetitively recycle the control unit through cycles of simulated on-off operation.
|
