| 摘要 |
The invention relates to a circuit arrangement for materials testing devices comprising a measurement transducer which generates an electrical quantity corresponding to strains in a specimen, and exhibits an evaluating device by means of which a switching signal can be generated. To be able to generate a switching signal selectively within a wide range of the strains by means of such a circuit arrangement, the evaluating device contains a slope detector (14) in which a derived quantity corresponding to the rate of change of the measurement quantity is generated. The slope detector (14) is followed by a limit stage (15) which generates the switching signal at a predetermined value of the derived quantity (Figure). <IMAGE>
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