MEASURING METHOD FOR MOUNTING ANGLE DISPLACEMENT OF SEMICONDUCTOR LASER PELLET,申请号JP19850215308-传众专利搜索

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发明名称	MEASURING METHOD FOR MOUNTING ANGLE DISPLACEMENT OF SEMICONDUCTOR LASER PELLET
摘要
申请公布号	JPS6273732(A)	申请公布日期	1987.04.04
申请号	JP19850215308	申请日期	1985.09.27
申请人	NEC CORP	发明人	MITSUNARI TOSHIHIRO
分类号	G01S17/88;H01L21/52;H01L21/58;H01L21/66;H01L21/68	主分类号	G01S17/88
代理机构		代理人
主权项
地址

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