发明名称 Method for making submicron mask openings using sidewall and lift-off techniques
摘要 A method is disclosed for making submicron openings in a substrate. A mesa is formed on the substrate by reactive ion etching techniques. A film is deposited over the entire structure and the mesa is selectively etched away to yield a submicron-sized opening in the film. Using the film as a mask, the substrate exposed thereby is reactively ion etched. An example is given for producing an emitter mask for a polycrystalline silicon base bipolar transistor.
申请公布号 US4654119(A) 申请公布日期 1987.03.31
申请号 US19850799053 申请日期 1985.11.18
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 COOK, ROBERT K.;SHEPARD, JOSEPH F.
分类号 H01L21/302;H01L21/033;H01L21/3065;(IPC1-7):H01L21/306 主分类号 H01L21/302
代理机构 代理人
主权项
地址