发明名称 Oxide etch
摘要 A new process for plasma etching silicon oxides in integrated circuit structures. A chemistry comprising both oxygen and nitrogen trifluoride is used, with oxygen the dominant component. This provides excellent selectivity to silicon. This etch chemistry also erodes photoresist rapidly, so that it is typically used in combination with a hard-masking process. One particular application of this invention is in a cantilever-etch-mask contact profiling process.
申请公布号 US4654112(A) 申请公布日期 1987.03.31
申请号 US19840655004 申请日期 1984.09.26
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 DOUGLAS, MONTE A.;BONIFIELD, THOMAS D.
分类号 C03C15/00;G03F7/36;H01L21/311;H01L21/768;(IPC1-7):B44C1/22;C03C25/06 主分类号 C03C15/00
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