Inspection booth for substrates coated with a thin film

摘要

Apparatus is disclosed for examining thin layers deposited on a glass substrate of the plate or strip type under a lighting environment similar to that of outside daylight. The apparatus comprises an inspection booth having a station for observing the surface to be checked and a curved arch above the station to reflect light onto the surface to be observed. The curved arch is uniformly illuminated, has a neutral color, and is curved in an approximately concave manner to direct the light uniformly onto the surface to be examined. This booth permits quality control of layers such as metallic oxides deposited on glass substrates.