Test device for electrical circuit boards

摘要

The invention relates to a test device for electrical circuit boards comprising test pins of different heights for sequentially testing the board via different contact groups, comprising a board carrying plate which can be adjusted into test height positions defined by a lift adjustment device and corresponding to the different height positions of the test pins by means of a lowering device in a housing. In known test devices having a carry plate which can be lowered by application of underpressure, it is disadvantageous that the test height positions are defined either by variations in underpressure or by springs with a spring hardness which is variable during the spring deflection. According to the invention, a functionally reliable and simple test device is created by the fact that at least one stepped blocking slider which is adjustable transversely to the direction of lowering of the carry plate in a number of positions corresponding to the number of test height positions is provided on which the carry plate can be supported at the test height positions.