State logic testing device for a logic circuit

摘要

A logic system of the type which has means for applying two-state logic testing signals to an input of a logic circuit to be tested is disclosed. A logic circuit to be tested has two output logic states. The system comprises control means for applying control signals having two logic states to the input of the logic circuit to be tested. The value of the two output logic states is dependent respectively on two input logic states of the control signals applied to the input of the logic circuit to be tested. Override means imposes each logic state of the test signals on the input of the logic circuit to be tested, independent of the logic state of the control signals.