发明名称 |
MANUFACTURE OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE:To decrease the effect exerted to upper element regions during the formation of a capacitance region, by surrounding an MOS transistor forming region near the surface of a semiconductor substrate with an oxide film or the like before forming capacities within deep grooves. CONSTITUTION:A resist mask 2 is deposited on a PSi substrate 1 and shallow grooves are formed on the substrate 1 by etching the same. An n<+> region 4 and a p<+> region 5 are provided in the grooves. An SiO2 film 6 is then deposited on the whole surface and is dry etched so that oxidized SiO2 films 7 are left only on the side faces of the grooves. The grooves in the substrate are further etched to form deep grooves. N<+> regions 8 are provided on the side faces of the grooves while p<+> regions 9 are provided on the bottom thereof. Finally, after the grooves are filled with polysilicon 15, 1 gate electrode 12, a source 11 and a drain 10 are formed. |
申请公布号 |
JPS6258671(A) |
申请公布日期 |
1987.03.14 |
申请号 |
JP19850198076 |
申请日期 |
1985.09.06 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
FUSE HARUHIDE;FUKUMOTO MASANORI;YAMADA TOSHIRO;ODANAKA SHINJI |
分类号 |
H01L27/04;H01L21/76;H01L21/822;H01L29/94 |
主分类号 |
H01L27/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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