发明名称
摘要 PURPOSE:To easily form both a mask arranging step and a channel stopper on the surface of a semiconductor substrate under self-arrangement, by utilizing the difference in impurity concentration. CONSTITUTION:An n<+>-layer 2 is provided on a p-type silicon substrate 1. When the layer 2 is oxidized at a low temperature under steam, oxide films 3, 4 are produced thick on the n<+>-layer 2 and thin on the p-type substrate 1, respectively. Boron ions are implanted through the thin film 4 to selectively make a thin p-layer 5 under self-arrangement. When a separating oxide film is produced in an epitaxial layer 6 on the p-layer 5, the layer 5 effectively acts as a channel stopper. A mask arranging step 7 is made on the epitaxial layer on the n<+>-layer 2 under self-arrangement.
申请公布号 JPS6211504(B2) 申请公布日期 1987.03.12
申请号 JP19780142373 申请日期 1978.11.20
申请人 HITACHI LTD 发明人 KOGIRIMA MASAHIKO;YAGI KUNIHIRO;TAMURA MASAO;MAKI MICHOSHI
分类号 H01L21/74;H01L21/027;H01L21/20;H01L21/205;H01L21/316;H01L21/76 主分类号 H01L21/74
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