发明名称 MANUFACTURE OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
摘要 PURPOSE:To prevent a wafer from cracking and scratching by a method wherein fin-like sheets are radially fixed on the lower part of a chuck main body. CONSTITUTION:Fin-like sheets 5 are radially fixed on the lower part of a chuck main body 1. The nearer to the periphery of the chuck main body 1, the higher the fins 5 while the parts of the fins 5 coming into contact with a wafer 4 are rounded not to scratch the wafer 4. As soon as the wafer 4 is attracted, the periphery of the same 4 comes into multiple point-contact with the fins 5 preliminarily fixed on the chuck main body 1 not to scratch the central part of the wafer 4. As for the subsidiary effect, any waste grown film produced from the surface scratches of the wafer 4 on the conventional chuck causing probable polution may be prevented from being produced due to lack of scratches.
申请公布号 JPS60124836(A) 申请公布日期 1985.07.03
申请号 JP19830232312 申请日期 1983.12.09
申请人 NIPPON DENKI KK 发明人 TOMIYAMA TOMOHIKO
分类号 B65G51/03;B23Q7/04;B65G49/07;B65H3/14;H01L21/67;H01L21/677;H01L21/68;H01L21/683;H01L21/687 主分类号 B65G51/03
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