发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 PURPOSE:To reduce a gap between adjacent electrode lead-out layers by a method wherein an electrode lead-out wire is formed of a metal silicide film in a self-matching manner on an electrode lead-out layer and an insulating film when an electrode is formed. CONSTITUTION:A contact hole 40 is formed in an oxide film 2 on a P-type Si substrate 1. Next, an N<+> type electrode lead-out layer 41 is formed through said hole 40, and then a metal film 5 is applied on the surface. Moreover, a resist film 71 is formed in a predetermined region on the film 5 and, with said film 71 used as a mask, Si is injected into the film 5. After the film 71 is removed, heat treatment is applied to turn a region 81 into a metal silicide film 51, and the remaining metal film is removed. Since said film 51 is formed in a self-matching manner, no unnecessary protruding region is formed. Next, a passivation film 3 is applied, a predetermined region of the film 3 is removed, and an electrode wiring 6 is formed in place of the region. According to this method, a gap between adjacent electrode lead-out layers can be reduced without being restricted by the minimum limit of a wiring gap of metal electrodes.
申请公布号 JPS6255930(A) 申请公布日期 1987.03.11
申请号 JP19850198217 申请日期 1985.09.05
申请人 MITSUBISHI ELECTRIC CORP 发明人 SUDA KAKUTAROU;HIRAO TADASHI
分类号 H01L21/28;H01L21/285;H01L21/331;H01L21/60 主分类号 H01L21/28
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