发明名称 INFRAROER DETEKTOR
摘要 A cadmium mercury telluride (C.M.T.) layer (5) is epitaxially grown on a substrate (1, 2) of, for example, cadmium telluride. The substrate (3) is subsequently etched away with a mixture of nitric, hydrofluoric and lactic acids. A thin barrier layer (3) of mercury telluride is provided which is not attacked by the above etching solution. This barrier layer is removed by polishing to leave an optically flat C.M.T. layer which may incorporate a cadmium telluride passivating layer on its surface. <IMAGE>
申请公布号 DK436984(A) 申请公布日期 1985.07.15
申请号 DK19840004369 申请日期 1984.09.13
申请人 MARCONI COMPANY LIMITED THE 发明人 BEVAN MALCOLM JOHN;SINGH SURENDRA PRATAP;GURNELL ANDREW WILLIAM;HYLIANDS MICHAEL JAMES;NICHOLSON LINDA KAY
分类号 H01L21/306;H01L21/465;H01L31/0296;H01L31/18 主分类号 H01L21/306
代理机构 代理人
主权项
地址