发明名称 MANUFACTURE OF CERAMIC THIN FILM SAMPLE PIECE FOR ELECTRON MICROSCOPIC OBSERVATION
摘要 PURPOSE:To manufacture a thin film sample piece for electron microscipic observation rapidly and easily by preparing an elementary piece by cutting a ceramic sample to a prescribed thickness, polishing the one surface with diamond paste, polishing mechanically and ionizedly another surface to concaved surface state. CONSTITUTION:A rod-shaped piece of about 4X4mm. is cut from the ceramic sample A by using diamond slicer, further the sample B is cut to 200mum thickness by using high speed cutter to obtain the elementary piece C. One surface of the piece C is polished by diamond polishing disc, and subjected finally to the finishing polishing by using 1mum diamond paste to obtain a sample piece 7. Next, the polished and finished surface of the piece 7 is adhered at the end surface of a supporting rod 5 with adhesive, and the unpolished surface is polished mechanically to concaved lense state by rotating motors 1, 2. If a hole is opened at the center part of the piece 7, said piece 7 is exfoliated and fihished finally by ion polisher.
申请公布号 JPS60128323(A) 申请公布日期 1985.07.09
申请号 JP19830236332 申请日期 1983.12.16
申请人 SHIN NIPPON SEITETSU KK 发明人 SAKATA SHIGEO
分类号 G01N1/32;(IPC1-7):G01N1/32 主分类号 G01N1/32
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