| 摘要 |
A method and means for testing a multi-nodal electronic circuit consist of comparing the signal at each node of the circuit under test which is excited by input signals with the signals at each node of a reference circuit which is excited by the same input signals, and terminates by an equal load as that of the circuit under test. Signals are forced from nodes of one of the two circuits to corresponding nodes of the other circuit whenever the signals at corresponding nodes are not the same. Only nodes in the circuit under test, which are connected to faulty components or faulty wiring, draw or supply current, to or from the reference circuit, a fact which is indicated and/or recorded thereby identifying the faulty portions of the circuit under test.
|
