| 摘要 |
PURPOSE:To easily detect the variations of a developing device, a conductive sleeve, a photosensitive body, and a developer, etc., and to prevent images from deteriorating and the developing device, photosensitive body, etc., from being broken by providing an abnormal detecting circuit where a reference value is set previously and comparing the state after specific recording with the reference value. CONSTITUTION:The abnormality detecting circuit 50 is equipped with the storage means 52 consisting of the 1st storage part 9 and the 2nd storage part 15. The reference value of a set maximum current value is stored in the 1st storage part 9, which is connected to the 2nd comparison part 10, so that the reference value is inputted to the 2nd comparison part 10. The 2nd storage part 15, on the other hand, is stored previously with the reference value of phase difference set on the basis of instantaneous values of a voltage and a current and connected to the 1st comparison part 16 to input the reference value. Further, the 1st comparison part 16 and the 2nd comparison part 10 are connected to a display part 17. The display part 17 displays the contents of input information. |
