发明名称 Method for adapting a test program for electrical circuits
摘要 In the case of a method for adapting a test program for electrical circuits to the circuit which is respectively to be tested, at least one example of the circuit is tested using the test program provided for a circuit, it being possible to repeat individual test steps. The measurements achieved during the individual test steps are displayed together with the test parameters used at the same time on a screen in such a manner that a correlation between the test parameters and the measurement results is visible. If necessary, the test parameters are changed and the changed test parameters are incorporated in the test program.
申请公布号 DE3530308(A1) 申请公布日期 1987.02.26
申请号 DE19853530308 申请日期 1985.08.24
申请人 BLAUPUNKT-WERKE GMBH 发明人 HAEGELI,EGBERT
分类号 G01R31/28;G01R31/3183;(IPC1-7):G01R31/28 主分类号 G01R31/28
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