发明名称 Semiconductor memory device
摘要 A semiconductor memory device, such as a MOS dynamic RAM device, having memory cells each comprising a transfer gate transistor and a capacitor. The capacitor is a so-called groove-type capacitor and has a conductive layer formed on an insulation film attached to the inside surface of a groove formed on a semiconductor substrate. The conductive layer is electrically coupled to the source of the transfer gate transistor. The capacitance of the capacitor is formed between the conductive layer and a second conductive layer formed on the conductive layer via an insulation film, and/or between the conductive layer and the semiconductor substrate.
申请公布号 US4646118(A) 申请公布日期 1987.02.24
申请号 US19840681290 申请日期 1984.12.13
申请人 FUJITSU LIMITED 发明人 TAKEMAE, YOSHIHIRO
分类号 H01L27/10;H01L21/822;H01L21/8242;H01L27/04;H01L27/08;H01L27/108;(IPC1-7):H01L29/78;H01L27/02 主分类号 H01L27/10
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