发明名称 Calibration standard for X-ray fluorescence thickness
摘要 Improved calibration standard construction for X-ray fluorescence thickness measurement gauges formed of one or more plated layers of known character and thickness disposed on an apertured supporting foil base and accessible to X-radiation through an aperture at the base of a conically shaped bore in a surrounding protective housing member.
申请公布号 US4646341(A) 申请公布日期 1987.02.24
申请号 US19850716986 申请日期 1985.03.28
申请人 UPA TECHNOLOGY, INC. 发明人 FINER, PAUL;WAHL, ROBERT O.;SILVERMAN, WILLIAM
分类号 G01B15/02;G01N23/223;(IPC1-7):G01N23/06;G01D18/00 主分类号 G01B15/02
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