发明名称 |
Calibration standard for X-ray fluorescence thickness |
摘要 |
Improved calibration standard construction for X-ray fluorescence thickness measurement gauges formed of one or more plated layers of known character and thickness disposed on an apertured supporting foil base and accessible to X-radiation through an aperture at the base of a conically shaped bore in a surrounding protective housing member.
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申请公布号 |
US4646341(A) |
申请公布日期 |
1987.02.24 |
申请号 |
US19850716986 |
申请日期 |
1985.03.28 |
申请人 |
UPA TECHNOLOGY, INC. |
发明人 |
FINER, PAUL;WAHL, ROBERT O.;SILVERMAN, WILLIAM |
分类号 |
G01B15/02;G01N23/223;(IPC1-7):G01N23/06;G01D18/00 |
主分类号 |
G01B15/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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