发明名称 Deposition of III-V semiconductor materials
摘要 A low temperature procedure for depositing III-V semiconductor materials that offers the possibility of higher deposition rates together with abrupt junction formation has been found. This process involves the irradiation at a deposition substrate with a high power density radiation source of deposition gases such as organometallic materials, e.g., trimethyl gallium and trimethyl indium. By utilizing a sufficiently high power density, multiphoton processes are induced in the deposition gas that, in turn, lead to advantageous deposited materials.
申请公布号 US4645687(A) 申请公布日期 1987.02.24
申请号 US19850778274 申请日期 1985.09.16
申请人 AT&T LABORATORIES 发明人 DONNELLY, VINCENT M.;KARLICEK, JR., ROBERT F.
分类号 H01L21/205;H01L21/268;(IPC1-7):H01L21/205 主分类号 H01L21/205
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