发明名称 |
NEGATIVE TYPE RESIST MATERIAL AND FORMATION OF RESIST PATTERN |
摘要 |
PURPOSE:To form a fine pattern having high resolving power by a simple process by using a negative type resist material made of the vinyldimethylsilyl ether of the naphthoquinonediazidosulfonic ester of cresol-novolak resin. CONSTITUTION:This negative type resist material is made of the vinyldimethylsilyl ether of the naphthoquinonediazidosulfonic ester of cresol- novolak resin. The vinyldimethylsilyl ether represented by formula II is obtd. by introducing vinyldimethylsilyl groups into the naphthoquinonediazidosulfonic ester of cresol-novolak resin represented by formula I. In the formulae, each of k, l, m and n is a positive integer, n=k+l and 4<=n+m<=20. The resist material is used as the resist of the upper resist layer of a two-layered resist film and can be exposed with far ultraviolet rays, so that resolution is obtd. |
申请公布号 |
JPS6240449(A) |
申请公布日期 |
1987.02.21 |
申请号 |
JP19850180821 |
申请日期 |
1985.08.17 |
申请人 |
OKI ELECTRIC IND CO LTD;FUJI YAKUHIN KOGYO KK |
发明人 |
ITO TOSHIO;YAMASHITA YOSHIO;KAWAZU TAKAHARU;ASANO TAKATERU;KOBAYASHI KENJI |
分类号 |
H01L21/30;G03C5/16;G03F7/004;G03F7/038;G03F7/075;H01L21/027 |
主分类号 |
H01L21/30 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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