发明名称 WAFER POLISHING DEVICE
摘要 PURPOSE:To enable the manufacture of a flat surface wafer without any distortion by providing a means wherein the larger a clearance is between the wafer and a polishing plate in a direction off the polishing plate, the smaller a force tends to be on a support plate. CONSTITUTION:With a clearance 8 formed between a wafer 1 dipped in a grinding liquid 11 and a polishing plate 7, the wafer 1 and the polishing plate 7 are made to have relative motion. Then, the polishing liquid 11 starts to flow at the clearance 8 between the wafer 1 and the polishing plate 7 and the more said relative motion is, the less the pressure is at the clearance 8. Consequently, a wafer supporting plate 2 held by grinders 5 and 6 are attracted toward the polishing plate 7 to such an extent that the clearances 8 becomes fine. In this case, a concave 10 formed on the polishing plate 7 works to help lowering the pressure by making an eddy in the fluid current. When grains contained in the polishing liquid 11 passes the clearance 8 at a high speed, they chafe, process in an atomic order accuracy and polish without any distortion, the wafer 1 respectively.
申请公布号 JPS6239173(A) 申请公布日期 1987.02.20
申请号 JP19850179601 申请日期 1985.08.14
申请人 NEC CORP 发明人 HAMAGUCHI TSUNEO
分类号 B24B37/005;B24B37/07 主分类号 B24B37/005
代理机构 代理人
主权项
地址
您可能感兴趣的专利