发明名称 Semiconductor device having a contact and device for producing it
摘要 A contact with a substrate (11) or a conductor situated underneath an opening (14) in an insulating layer (13) is made by depositing a thin film (15) of a refractory metal using a selective vapour-phase forming process so that the metal film (15) forms above the exposed surface and then creeps up the side walls of the insulating layer (13). The electrical contact is made by covering the thin film with a thicker structure of a refractory metal, preferably using a second selective vapour-phase forming process, and then a conducting film is deposited on top of the insulating layer in electrical contact with the thicker metal structure. <IMAGE>
申请公布号 DE3625860(A1) 申请公布日期 1987.02.12
申请号 DE19863625860 申请日期 1986.07.31
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 NAKATA,REMPEI
分类号 H01L21/285;H01L21/28;H01L21/60;H01L21/768;H01L23/532;(IPC1-7):H01L21/90;H01L23/52 主分类号 H01L21/285
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