发明名称 |
FIELD EFFECT TRANSISTOR AND METHOD FOR ITS PRODUCTION |
摘要 |
A method of producing a MOSFET comprises the steps of forming a thick insulating layer (11) having an inclined surface surrounding an active region of a semiconouctor substrate (12); forming a thin insulating layer (13) on the active region; forming a gate electrode crossing the thin insulating layer (13) and extending onto the thick insulating layer (11); and forming a source region (S) and a drain region (D) in the active region. The gate electrode forming step comprises forming a conductive layer (14) on the thin insulating layer (13) and thick insulating layer (11); forming a resist layer (15) on the conductive layer (14); selectively exposing the resist layer (15) to a radiation beam to define a gate electrode pattern area (19) of which a portion above the inclined surface and above the end portions of the active region is wider than another portion above the middle portion of the active region; developing the resist layer (15); and selectively etching the conductive layer by using the developed resist layer (21) as a mask. |
申请公布号 |
DE3274925(D1) |
申请公布日期 |
1987.02.05 |
申请号 |
DE19823274925 |
申请日期 |
1982.08.10 |
申请人 |
FUJITSU LIMITED |
发明人 |
FURUYA, TOSHIKAZU |
分类号 |
H01L21/28;H01L21/336;H01L21/762;H01L29/423;H01L29/78;(IPC1-7):H01L21/28;H01L21/76 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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