| 摘要 |
A timing or logic state analyzer automatically places marks into a captured trace measurement. The definition of each mark may include an associated collection of logical conditions in the captured data. Once the trace measurement is complete the analyzer searches through the captured data, locates where any defined conditions occur and adds the associated mark into the corresponding location of the reconstructed waveforms or trace list. Certain marks may be placed at each occurrence of a specified event in the trace, while other marks are restricted to placement at the first occurrence. Marks can be defined in terms of prior and subsequent occurrence of other marks, or of other features in the trace such as a user positionable cursor or a stated sample number. The definition of the marks need not be specified prior to the trace measurement, and an existing trace measurement already captured can be examined and re-examined with different marking schemes without repeating the overall trace measurement. Additionally, certain measurements can be made upon the marks. The time interval between a selected pair of marks can be automatically measured, as can the number of other marks between that pair of marks. And finally, repeated trace measurements with marks can be executed automatically with the resulting series of time interval or count measurements automatically characterized with the statistics maximum, minimum, mean and standard deviation.
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