发明名称 OPTICAL SEMICONDUCTOR MEASURING APPARATUS
摘要 PURPOSE:To achieve simultaneous measurement of a light output and the wave length thereof of an optical semiconductor such as laser diode, by providing a branch means of branching off the output light of the optical semiconductor. CONSTITUTION:The output light of an optical semiconductor 1 is branched off by a branch means 3 and most of the lights are made incident into a light output detector 6 to detect and measure the light output. On the other hand, the remainder of the light from the branch means 3 is made incident into a wavelength measuring device 5 to measure the wavelength thereof. In this man ner, the light output and the wavelength are measured simultaneously. The light output Po of the detector 6 is inputted into comparison means 7 of a driving circuit 10 to control the current I to be fed to the optical semiconductor 1 from a power source 9 by regulating a control element 8 to have it coinciding with the set value Ps. Varying the set value Ps enables the measurement of the output light at various current values and varying the temperature of the optical semiconductor 1 performs the measurement of the temperature character istic in the light output and the wavelength while permitting the measurement of aging with the progress thereof. This allows a smaller size and less measuring time.
申请公布号 JPS6224125(A) 申请公布日期 1987.02.02
申请号 JP19850164725 申请日期 1985.07.25
申请人 CHINO CORP 发明人 ITO HITOSHI;ONOZAWA SEIJI
分类号 G01R31/26;G01J1/00;G01J1/42;G01M11/00 主分类号 G01R31/26
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