发明名称
摘要 PURPOSE:To shorten the correction time of a diagnostic dictionary by using a fault dictionary as it is, and varying the number of scan-out clocks, a scan-out address, and a normal value directly without the intervention of fault simultation. CONSTITUTION:Existent diagnostic data for a block number (i) of an objective to be corrected and new diagnostic data after correction are each ccomposed of a test input A and a diagnostic dictionary B, which consists of the numbers (n) and (m) of scan-out clocks, scan-out addresses (a) and (b), normal values (x) and (y), and a fault dictionary alpha as a minimum unit. Solid-line arrows E show data used as new diagnostic data without modification, and broken-line arrows E' show data which should be corrected attending hardware changes. The correction is made without intervention of fault simulation, so the processing time is shortened.
申请公布号 JPS624743(B2) 申请公布日期 1987.01.31
申请号 JP19810151054 申请日期 1981.09.24
申请人 FUJITSU LTD 发明人 HIRAOKA YASUNORI
分类号 G06F11/22;G06F11/26 主分类号 G06F11/22
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