发明名称
摘要 PURPOSE:To scan wavelengths even in fixed slit width, by feeding back a control system to the gains of an operational amplifier as the quantity of resistance value, which changes. CONSTITUTION:A CPU1, a ROM memory 2, a RAM memory 3, an I/O 4 for control, etc. are mounted to this device, and perform main control and data processing. The resistance of resistance R1, R2...R8 is connected in parallel in the input resistance 9 of an operational amplifier 7, and arbitrary resistance can be set by turning a switch group 31 ON-OFF in the resistance. Amplifier gains can be changed over by combining SW1-SW8. Since a control system is not fed back to a slit 20 of a monochro-meter, fixed slit width set by operators is kept even when wave lengths are scanned, and spectra in the same bandpass are recorded over the whole range.
申请公布号 JPS623364(B2) 申请公布日期 1987.01.24
申请号 JP19780136727 申请日期 1978.11.08
申请人 HITACHI LTD 发明人 AKITOMO NOBUO;MURAKOSHI TAKEO
分类号 G01J3/42 主分类号 G01J3/42
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