发明名称 PROCEDIMENTO PER CALIBRARE UN ELEMENTO A RESISTENZA ELETTRICA
摘要 A method of trimming a resistance element is disclosed which comprises cutting transversely into one side of the element until the measured total resistance of the element increases by a fraction 1/N of a fixed percentage of a desired total resistance value. The fraction 1/N is approximately equal to the path length of the resistance element divided by the designed width of the transverse cut and the fixed percentage is equal to the percent deviation of the initial total resistance of the element from a nominal, desired resistance value. After the transverse cut is made, a longitudinal-type cut is made at a distance, equal to the length of the transverse cut, from the edge of the element having the transverse cut to isolate a portion of the element from the remainder of the element so that the isolated portion has the desired total resistance. This method is particularly suitable for use with computer controlled laser trimming systems used to mass produce resistance elements.
申请公布号 IT1154605(B) 申请公布日期 1987.01.21
申请号 IT19820024568 申请日期 1982.12.02
申请人 SPECTROL ELECTRONICS CORP. 发明人 TURNER BRADLEY D.;RILEY RICHARD E.
分类号 H01C17/242;(IPC1-7):H01R/ 主分类号 H01C17/242
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