发明名称 |
DISTANCE MEASURING APPARATUS |
摘要 |
PURPOSE:To reduce measurement errors caused by pattern distributing condition and line width and conduct high-accuracy measurement, by correcting a slice level of an edge distance detecting unit according to the edge distances. CONSTITUTION:A pattern 3a formed on a mask on a stage 4 is observed with an objective lens 5 as an image pick-up system. An enlarged image of the pattern 3a is detected with a photoelectric sensor 50 and distribution of luminous intensities is read into a memory 51 through an A/D converting circuit 102. An edge distance detecting unit 52 detects leading and trailing edge positions from a luminous intensity distribution waveform and the distance is displayed on a display unit 108. A slice level is corrected according to the edge distance subjected to measurement with a correcting unit 53. The correcting amount is stored as a table as predetermined after adding various conditions of the optical system and the edge distances. A distance-identifying unit 54 judges whether correction is necessary or not. |
申请公布号 |
JPS6211110(A) |
申请公布日期 |
1987.01.20 |
申请号 |
JP19850150927 |
申请日期 |
1985.07.09 |
申请人 |
NIPPON KOGAKU KK <NIKON> |
发明人 |
SUDO TAKESHI;KUMAZAWA MASAHITO;ISHIZEKI TATSUMI |
分类号 |
G01B11/02;G01B11/14;G01N21/88;G01N21/956;G03F7/20;H01L21/027;H01L21/30;H01L21/66 |
主分类号 |
G01B11/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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