发明名称 APPARATUS FOR INSPECTING FOREIGN MATTER
摘要 PURPOSE:To efficiently perform visual inspection, by storing the positional information of foreign matter detected on the basis of reflected light and the information of a visual observation result in the table on a memory so as to allow both informations to respectively correspond to the foreign matter. CONSTITUTION:A microprocessor 120 indicates the start of scanning to a motor controller 116 through an interface circuit 108 and drives a stepping motor 14 and a DC motor 24. Then, results by scanning, such as the number, position, kind, property, size, etc. of foreign matter are written in the table 124D on RAM124. By indicating the number of the foreign matter written in RAM124, the positional information thereof is read and an article to be inspected is moved so that the indicated foreign matter enters the visual field of a microscope. Further, a visual observation result is written in RAM124 so as to correspond to the number of the foreign matter.
申请公布号 JPS6211139(A) 申请公布日期 1987.01.20
申请号 JP19850140148 申请日期 1985.06.28
申请人 HITACHI ELECTRONICS ENG CO LTD 发明人 TANIUCHI TOSHIAKI
分类号 G01N21/88;G01N21/94;G01N21/956;G06T1/00;H01L21/66 主分类号 G01N21/88
代理机构 代理人
主权项
地址