发明名称 |
INCLINED TRANSFER LINE SCANNING INSPECTION METHOD |
摘要 |
PROBLEM TO BE SOLVED: To simplify the process for inspecting a glass substrate used for a flat-panel display, and to enhance inspection accuracy and inspection speed. SOLUTION: The inclined transfer line scanning inspection method determines defects on the glass substrate, by performing comparison processings among the gray values of pixels obtained by line scanning of the glass substrate transferred with inclination, the threshold of sensitivity of the hardware, and the threshold of the inspection sensitivity. COPYRIGHT: (C)2005,JPO&NCIPI
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申请公布号 |
JP2004361385(A) |
申请公布日期 |
2004.12.24 |
申请号 |
JP20030433045 |
申请日期 |
2003.12.26 |
申请人 |
SAMSUNG CORNING PRECISION GLASS CO LTD |
发明人 |
LEE SHOKA;KIM TAKUTEN;KIM SEKISHUN;KIM KI-NAM |
分类号 |
G01B11/30;G01N21/00;G01N21/958;G02B26/10;G02F1/13;(IPC1-7):G01N21/958 |
主分类号 |
G01B11/30 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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