发明名称 |
EVALUATION SPECIMEN FOR SURFACE INSPECTION APPARATUS |
摘要 |
PURPOSE:To accurately calibrate a surface inspection apparatus, by adhering standard particles having the same particle size subjected to diffusion averaging to the specific surface area of a clean specimen plate so as to be capable of discriminating an adhered part and a non-adhered part. CONSTITUTION:Standard particles having the same particle size subjected to diffusion averaging are adhered to the specific surface area of a clean specimen plate 2 so as to be capable of discriminate an adhered part and a non-adhered part. By this method, the shape of the standard particles can be allowed to correspond to the shape of a minute flaw such as actual dust and the quantities of reflected lights therefrom become almost equal. Therefore, the peak value of the signal detecting the standard particles can be accurately compared with that of the signal detecting actual dust particles with correlation. As a result, a surface inspection apparatus can be accurately calibrated by using an evaluation specimen 5. |
申请公布号 |
JPS6211134(A) |
申请公布日期 |
1987.01.20 |
申请号 |
JP19850136161 |
申请日期 |
1985.06.24 |
申请人 |
HITACHI ELECTRONICS ENG CO LTD |
发明人 |
HOURAI IZUO;NARA KEI;SATO SUSUMU;MABUCHI FUMITAKA |
分类号 |
G01N21/88;G01N21/93;G01N21/94;G01N21/956 |
主分类号 |
G01N21/88 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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